nanowires
Research Topic
Language: English
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Research problems linked to this topic
- Interfacing neurons with micro- and nano-electronic devices has been a subject of intense study over the last decade.
- Biological molecules, in particular DNA, have shown great potential to be used as interconnects of nanodevices and computational elements.
- The evolution of the structure of glass-coated Fe40Ni38Mo4B16 amorphous microwire with thermal treatments and its interplay with magnetism has been studied.
- Fabrication of Nanodots on semiconductor surfaces has immense importance due to their application in memory and optoelectronic devices.
- Nanowires (NWs) have attracted considerable scientific interest in fabricating high performance electronic and optical devices.
- Loading misalignment and tapering of nanowires are usually unavoidable factors in compression and tensile mechanical property testing of nanowires.
- Increasing the critical current density (Jc) of the multifilamentary round wire Ag/Bi2Sr2CaCu2Ox(2212) requires understanding its complicated microstructure, in which extensive bridges between filaments are prominent.
- An ultralight, conductive, and flexible 3D assembly of a metal oxide nanowire aerogel as an electrode for energy storage devices without additives and typically inconvenient flexible supported-substrates remains a challenge.
- Elastic and tribological properties of zinc oxide nanowires (NWs) on Si wafer and highly oriented pyrolytic graphite (HOPG) are experimentally investigated and theoretically interpreted.
- Cables (or wire ropes) made from NiTi shape memory alloy (SMA) wires are relatively new and unexplored structural elements that combine many of the advantages of conventional cables with the adaptive properties of SMAs (shape memory and superelasticity) and have a broad range of potential applications.
- a carbon nanofiber (CNF) interconnect device, electrode contacts formed by tungsten (W) deposition using focused ion beam is effective in reducing the contact resistance, but can potentially damage the test device because of its high energy.